Two-wavelength phase shift interferometry to characterize ballistic features

Glenn W. Pagano, Christopher J Mann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9131
ISBN (Print)9781628410792
DOIs
StatePublished - 2014
EventUnknown conference - Brussels, Belgium
Duration: Apr 15 2014Apr 17 2014

Other

OtherUnknown conference
CountryBelgium
CityBrussels
Period4/15/144/17/14

Fingerprint

Surface Profile
Ballistics
Interferometry
Phase Shift
Phase shift
ballistics
cartridges
interferometry
casing
phase shift
Wavelength
Interferogram
Phase Shifting
profiles
wavelengths
weapons
Distinct
Calculate
examination
Profile

Keywords

  • 3D surface measurements
  • Ballistics
  • Interferometry
  • Phase Shift Interferometry

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Pagano, G. W., & Mann, C. J. (2014). Two-wavelength phase shift interferometry to characterize ballistic features. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9131). [91311K] SPIE. https://doi.org/10.1117/12.2051859

Two-wavelength phase shift interferometry to characterize ballistic features. / Pagano, Glenn W.; Mann, Christopher J.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9131 SPIE, 2014. 91311K.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pagano, GW & Mann, CJ 2014, Two-wavelength phase shift interferometry to characterize ballistic features. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9131, 91311K, SPIE, Unknown conference, Brussels, Belgium, 4/15/14. https://doi.org/10.1117/12.2051859
Pagano GW, Mann CJ. Two-wavelength phase shift interferometry to characterize ballistic features. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9131. SPIE. 2014. 91311K https://doi.org/10.1117/12.2051859
Pagano, Glenn W. ; Mann, Christopher J. / Two-wavelength phase shift interferometry to characterize ballistic features. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9131 SPIE, 2014.
@inproceedings{fbe1395fdc4446a4abc290d606f2c3cc,
title = "Two-wavelength phase shift interferometry to characterize ballistic features",
abstract = "We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.",
keywords = "3D surface measurements, Ballistics, Interferometry, Phase Shift Interferometry",
author = "Pagano, {Glenn W.} and Mann, {Christopher J}",
year = "2014",
doi = "10.1117/12.2051859",
language = "English (US)",
isbn = "9781628410792",
volume = "9131",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",

}

TY - GEN

T1 - Two-wavelength phase shift interferometry to characterize ballistic features

AU - Pagano, Glenn W.

AU - Mann, Christopher J

PY - 2014

Y1 - 2014

N2 - We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.

AB - We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.

KW - 3D surface measurements

KW - Ballistics

KW - Interferometry

KW - Phase Shift Interferometry

UR - http://www.scopus.com/inward/record.url?scp=84902279217&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84902279217&partnerID=8YFLogxK

U2 - 10.1117/12.2051859

DO - 10.1117/12.2051859

M3 - Conference contribution

SN - 9781628410792

VL - 9131

BT - Proceedings of SPIE - The International Society for Optical Engineering

PB - SPIE

ER -