Two-wavelength phase shift interferometry to characterize ballistic features

Glenn W. Pagano, Christopher J. Mann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.

Original languageEnglish (US)
Title of host publicationOptical Modelling and Design III
PublisherSPIE
ISBN (Print)9781628410792
DOIs
StatePublished - Jan 1 2014
EventUnknown conference - Brussels, Belgium
Duration: Apr 15 2014Apr 17 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9131
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherUnknown conference
CountryBelgium
CityBrussels
Period4/15/144/17/14

Keywords

  • 3D surface measurements
  • Ballistics
  • Interferometry
  • Phase Shift Interferometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Pagano, G. W., & Mann, C. J. (2014). Two-wavelength phase shift interferometry to characterize ballistic features. In Optical Modelling and Design III [91311K] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9131). SPIE. https://doi.org/10.1117/12.2051859