Temperature-dependence of water bridge formation in atomic force microscopy

Brent A Nelson, Lawrence A. Bottomley, Mark A. Poggi, William P. King

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

When an Atomic Force Microscope (AFM) is operated in air, capillary condensation induces meniscus formation between the AFM tip and substrate. At present, no models account for the temperature-dependence of meniscus formation. This paper describes experiments measuring capillary forces between an AFM tip and mica at various temperatures and times. At low humidity, the capillary force decreases with increasing surface temperature in a manner unaccounted for by merely the dependence of water surface energy on temperature. We propose that this is due to water evaporation off the heated surface. The adhesion is also shown to decrease significantly with time until stabilizing after approximately an hour of experiments. Localized heating of the surface by the AFM laser is proposed as the cause of adhesion decrease. The decrease in force occurring at high surface temperatures implies a reduction in meniscus size that may potentially improve the resolution of AFM-based nanolithography techniques.

Original languageEnglish (US)
Title of host publicationAmerican Society of Mechanical Engineers, Micro-Electromechanical Systems Division Publication (MEMS)
PublisherAmerican Society of Mechanical Engineers
Pages629-636
Number of pages8
Volume5
ISBN (Print)0791837211, 9780791837214
StatePublished - 2003
Externally publishedYes
Event2003 ASME International Mechanical Engineering Congress - Washington, DC, United States
Duration: Nov 15 2003Nov 21 2003

Other

Other2003 ASME International Mechanical Engineering Congress
CountryUnited States
CityWashington, DC
Period11/15/0311/21/03

Fingerprint

Atomic force microscopy
Microscopes
Water
Adhesion
Temperature
Nanolithography
Mica
Interfacial energy
Condensation
Atmospheric humidity
Evaporation
Experiments
Heating
Lasers
Substrates
Air

Keywords

  • Adhesion
  • AFM
  • Meniscus
  • Nanolithography
  • Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Nelson, B. A., Bottomley, L. A., Poggi, M. A., & King, W. P. (2003). Temperature-dependence of water bridge formation in atomic force microscopy. In American Society of Mechanical Engineers, Micro-Electromechanical Systems Division Publication (MEMS) (Vol. 5, pp. 629-636). American Society of Mechanical Engineers.

Temperature-dependence of water bridge formation in atomic force microscopy. / Nelson, Brent A; Bottomley, Lawrence A.; Poggi, Mark A.; King, William P.

American Society of Mechanical Engineers, Micro-Electromechanical Systems Division Publication (MEMS). Vol. 5 American Society of Mechanical Engineers, 2003. p. 629-636.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nelson, BA, Bottomley, LA, Poggi, MA & King, WP 2003, Temperature-dependence of water bridge formation in atomic force microscopy. in American Society of Mechanical Engineers, Micro-Electromechanical Systems Division Publication (MEMS). vol. 5, American Society of Mechanical Engineers, pp. 629-636, 2003 ASME International Mechanical Engineering Congress, Washington, DC, United States, 11/15/03.
Nelson BA, Bottomley LA, Poggi MA, King WP. Temperature-dependence of water bridge formation in atomic force microscopy. In American Society of Mechanical Engineers, Micro-Electromechanical Systems Division Publication (MEMS). Vol. 5. American Society of Mechanical Engineers. 2003. p. 629-636
Nelson, Brent A ; Bottomley, Lawrence A. ; Poggi, Mark A. ; King, William P. / Temperature-dependence of water bridge formation in atomic force microscopy. American Society of Mechanical Engineers, Micro-Electromechanical Systems Division Publication (MEMS). Vol. 5 American Society of Mechanical Engineers, 2003. pp. 629-636
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