STUDY OF TRANSFER EXCITATION IN F8 + plus He, Ne AND Ar COLLISIONS.

Philip L. Pepmiller, Patrick Richard, J. Newcomb, R. Dillingham, J. M. Hall, Tom J. Gray, M. Stockli

Research output: Contribution to journalArticle

17 Scopus citations

Abstract

High resolution x-ray spectroscopy has been used to measure F K x-rays resulting from the decay of doubly excited two electron states. These states may be formed by nonresonant transfer excitation, in which electron excitation is coupled with electron capture to an excited state, or by resonant transfer excitation, a process related to dielectronic recombination, in which the capture of a loosely bound target electron results in projectile electron excitation. Calculations have been performed to estimate the contribution of each process to the total measured cross section.

Original languageEnglish (US)
Pages (from-to)1002-1004
Number of pages3
JournalIEEE Transactions on Nuclear Science
VolumeNS-30
Issue number2
StatePublished - Apr 1982
Externally publishedYes

    Fingerprint

ASJC Scopus subject areas

  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

Cite this

Pepmiller, P. L., Richard, P., Newcomb, J., Dillingham, R., Hall, J. M., Gray, T. J., & Stockli, M. (1982). STUDY OF TRANSFER EXCITATION IN F8 + plus He, Ne AND Ar COLLISIONS. IEEE Transactions on Nuclear Science, NS-30(2), 1002-1004.