High resolution x-ray spectroscopy has been used to measure F K x-rays resulting from the decay of doubly excited two electron states. These states may be formed by nonresonant transfer excitation, in which electron excitation is coupled with electron capture to an excited state, or by resonant transfer excitation, a process related to dielectronic recombination, in which the capture of a loosely bound target electron results in projectile electron excitation. Calculations have been performed to estimate the contribution of each process to the total measured cross section.
|Original language||English (US)|
|Number of pages||3|
|Journal||IEEE Transactions on Nuclear Science|
|State||Published - Apr 1982|
ASJC Scopus subject areas
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering