Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

Garold L. Gresham, Gary S. Groenewold, William F. Bauer, Jani C Ingram, Recep Avci

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Citations (Scopus)

Abstract

A variety of paint and fingernail polish samples, which were visually similar, but had different chemical compositions, were analyzed using three static secondary ion mass spectrometry (SIMS) techniques. These techniques included: 1) high spatial resolution/high mass resolution imaging time-of-flight SIMS; 2) analysis of stabilized high mass secondary ions with an ion trap SIMS capable of MS/MS; 3) qualitative characterization using a quadrupole SIMS with `pulsed extraction' charge compensation. In some cases, distinguishing between different coatings was easily achieved because of the presence of dominant ions derived from the components of the coating materials in the SIMS spectra. In other instances, coating distinction was difficult within a product group because of spectral complexity; for this reason, multivariate statistical techniques were employed, which allowed meaningful classification of spectra. Partial Least Squares and Principle Component Analysis were applied to quadrupole SIMS data. When using Partial Least Squares analysis reasonably accurate coating identification was achieved with the preliminary data with overall correct identifications at greater than 90% sensitivity.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsK. Higgins
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages66-72
Number of pages7
Volume3576
StatePublished - 1999
Externally publishedYes

Fingerprint

Nails
paints
Secondary ion mass spectrometry
Paint
secondary ion mass spectrometry
coatings
Coatings
Ions
quadrupoles
chemical composition
ions
spatial resolution
Imaging techniques
sensitivity
high resolution
products
Chemical analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Gresham, G. L., Groenewold, G. S., Bauer, W. F., Ingram, J. C., & Avci, R. (1999). Static secondary ion mass spectrometry characterization of nail polish and paint surfaces. In K. Higgins (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3576, pp. 66-72). Society of Photo-Optical Instrumentation Engineers.

Static secondary ion mass spectrometry characterization of nail polish and paint surfaces. / Gresham, Garold L.; Groenewold, Gary S.; Bauer, William F.; Ingram, Jani C; Avci, Recep.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / K. Higgins. Vol. 3576 Society of Photo-Optical Instrumentation Engineers, 1999. p. 66-72.

Research output: Chapter in Book/Report/Conference proceedingChapter

Gresham, GL, Groenewold, GS, Bauer, WF, Ingram, JC & Avci, R 1999, Static secondary ion mass spectrometry characterization of nail polish and paint surfaces. in K Higgins (ed.), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3576, Society of Photo-Optical Instrumentation Engineers, pp. 66-72.
Gresham GL, Groenewold GS, Bauer WF, Ingram JC, Avci R. Static secondary ion mass spectrometry characterization of nail polish and paint surfaces. In Higgins K, editor, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3576. Society of Photo-Optical Instrumentation Engineers. 1999. p. 66-72
Gresham, Garold L. ; Groenewold, Gary S. ; Bauer, William F. ; Ingram, Jani C ; Avci, Recep. / Static secondary ion mass spectrometry characterization of nail polish and paint surfaces. Proceedings of SPIE - The International Society for Optical Engineering. editor / K. Higgins. Vol. 3576 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 66-72
@inbook{3d3427b3b98d4e54bb5f2a32838a1651,
title = "Static secondary ion mass spectrometry characterization of nail polish and paint surfaces",
abstract = "A variety of paint and fingernail polish samples, which were visually similar, but had different chemical compositions, were analyzed using three static secondary ion mass spectrometry (SIMS) techniques. These techniques included: 1) high spatial resolution/high mass resolution imaging time-of-flight SIMS; 2) analysis of stabilized high mass secondary ions with an ion trap SIMS capable of MS/MS; 3) qualitative characterization using a quadrupole SIMS with `pulsed extraction' charge compensation. In some cases, distinguishing between different coatings was easily achieved because of the presence of dominant ions derived from the components of the coating materials in the SIMS spectra. In other instances, coating distinction was difficult within a product group because of spectral complexity; for this reason, multivariate statistical techniques were employed, which allowed meaningful classification of spectra. Partial Least Squares and Principle Component Analysis were applied to quadrupole SIMS data. When using Partial Least Squares analysis reasonably accurate coating identification was achieved with the preliminary data with overall correct identifications at greater than 90{\%} sensitivity.",
author = "Gresham, {Garold L.} and Groenewold, {Gary S.} and Bauer, {William F.} and Ingram, {Jani C} and Recep Avci",
year = "1999",
language = "English (US)",
volume = "3576",
pages = "66--72",
editor = "K. Higgins",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Society of Photo-Optical Instrumentation Engineers",

}

TY - CHAP

T1 - Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

AU - Gresham, Garold L.

AU - Groenewold, Gary S.

AU - Bauer, William F.

AU - Ingram, Jani C

AU - Avci, Recep

PY - 1999

Y1 - 1999

N2 - A variety of paint and fingernail polish samples, which were visually similar, but had different chemical compositions, were analyzed using three static secondary ion mass spectrometry (SIMS) techniques. These techniques included: 1) high spatial resolution/high mass resolution imaging time-of-flight SIMS; 2) analysis of stabilized high mass secondary ions with an ion trap SIMS capable of MS/MS; 3) qualitative characterization using a quadrupole SIMS with `pulsed extraction' charge compensation. In some cases, distinguishing between different coatings was easily achieved because of the presence of dominant ions derived from the components of the coating materials in the SIMS spectra. In other instances, coating distinction was difficult within a product group because of spectral complexity; for this reason, multivariate statistical techniques were employed, which allowed meaningful classification of spectra. Partial Least Squares and Principle Component Analysis were applied to quadrupole SIMS data. When using Partial Least Squares analysis reasonably accurate coating identification was achieved with the preliminary data with overall correct identifications at greater than 90% sensitivity.

AB - A variety of paint and fingernail polish samples, which were visually similar, but had different chemical compositions, were analyzed using three static secondary ion mass spectrometry (SIMS) techniques. These techniques included: 1) high spatial resolution/high mass resolution imaging time-of-flight SIMS; 2) analysis of stabilized high mass secondary ions with an ion trap SIMS capable of MS/MS; 3) qualitative characterization using a quadrupole SIMS with `pulsed extraction' charge compensation. In some cases, distinguishing between different coatings was easily achieved because of the presence of dominant ions derived from the components of the coating materials in the SIMS spectra. In other instances, coating distinction was difficult within a product group because of spectral complexity; for this reason, multivariate statistical techniques were employed, which allowed meaningful classification of spectra. Partial Least Squares and Principle Component Analysis were applied to quadrupole SIMS data. When using Partial Least Squares analysis reasonably accurate coating identification was achieved with the preliminary data with overall correct identifications at greater than 90% sensitivity.

UR - http://www.scopus.com/inward/record.url?scp=0032665310&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032665310&partnerID=8YFLogxK

M3 - Chapter

VL - 3576

SP - 66

EP - 72

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Higgins, K.

PB - Society of Photo-Optical Instrumentation Engineers

ER -