Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

Garold L. Gresham, Gary S. Groenewold, William F. Bauer, Jani C. Ingram, Recep Avci

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

A variety of paint and fingernail polish samples, which were visually similar, but had different chemical compositions, were analyzed using three static secondary ion mass spectrometry (SIMS) techniques. These techniques included: 1) high spatial resolution/high mass resolution imaging time-of-flight SIMS; 2) analysis of stabilized high mass secondary ions with an ion trap SIMS capable of MS/MS; 3) qualitative characterization using a quadrupole SIMS with `pulsed extraction' charge compensation. In some cases, distinguishing between different coatings was easily achieved because of the presence of dominant ions derived from the components of the coating materials in the SIMS spectra. In other instances, coating distinction was difficult within a product group because of spectral complexity; for this reason, multivariate statistical techniques were employed, which allowed meaningful classification of spectra. Partial Least Squares and Principle Component Analysis were applied to quadrupole SIMS data. When using Partial Least Squares analysis reasonably accurate coating identification was achieved with the preliminary data with overall correct identifications at greater than 90% sensitivity.

Original languageEnglish (US)
Pages (from-to)66-72
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3576
StatePublished - Jan 1 1999
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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