Series comparative measurements of thermal conductivity with thermistors

R. G. Morris, William G Delinger

Research output: Contribution to journalArticle

Abstract

Thermistors (negative temperature coefficient resistances) matched in pairs by the Godin technique have been employed in a Wheatstone bridge circuit to measure thermal conductivity of silicon from 300 to 470°K by the series comparative method. Resulting values are lower than those obtained previously but the measurement uncertainties of the two methods overlap.

Original languageEnglish (US)
Article number432
Pages (from-to)910-911
Number of pages2
JournalJournal of Scientific Instruments
Volume42
Issue number12
DOIs
StatePublished - 1965
Externally publishedYes

Fingerprint

Thermal Conductivity
Bridge circuits
Wheatstone bridges
Thermistors
thermistors
Thermal conductivity
thermal conductivity
Silicon
silicon
Uncertainty
Temperature
temperature

ASJC Scopus subject areas

  • Engineering(all)
  • Instrumentation

Cite this

Series comparative measurements of thermal conductivity with thermistors. / Morris, R. G.; Delinger, William G.

In: Journal of Scientific Instruments, Vol. 42, No. 12, 432, 1965, p. 910-911.

Research output: Contribution to journalArticle

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