Rapid detection of tri-n-butyl phosphate on environmental surfaces using static SIMS

Gary S. Groenewold, Jani C Ingram, James E. Delmore, Anthony D. Appelhans, David A. Dahl

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

Static secondary ion mass spectrometry (SIMS) is an analytical method that can be used to detect the presence of tri-n-butyl phosphate (TBP) on environmental surfaces including minerals (e.g., basalts, quartz) and vegetation. Static SIMS instrumentation equipped with pulsed secondary ion extraction and a ReO4- primary ion gun permits the rapid acquisition of cation and anion mass spectra of samples surfaces with virtually no sample preparation: samples are merely attached to a sample holder using double-stick tape. SIM spectra were demonstrated to be sensitive to the mode of TBP adsorption to mineral surfaces: TBP adsorbed to Fe(II)-bearing phases, Fe(III)-bearing phases, silicate, and vegetation surfaces could be distinguished from one another. These results indicate that SIMS has broad applicability for the rapid characterization of environmental surfaces, and in some cases, is capable of identifying the mode of contaminant-surface interactions. The technique is also attractive because it can analyze milligram-size samples, and no waste is generated during analysis.

Original languageEnglish (US)
Pages (from-to)359-370
Number of pages12
JournalJournal of Hazardous Materials
Volume41
Issue number2-3
DOIs
StatePublished - 1995
Externally publishedYes

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ASJC Scopus subject areas

  • Environmental Chemistry
  • Environmental Engineering
  • Health, Toxicology and Mutagenesis
  • Pollution
  • Waste Management and Disposal
  • Environmental Science(all)
  • Earth and Planetary Sciences(all)
  • Chemical Health and Safety
  • Process Chemistry and Technology
  • Safety, Risk, Reliability and Quality

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