Projectile K-Auger-electron production by bare, one-, and two-electron ions

Thomas R Dillingham, J. Newcomb, James Hall, Philip L. Pepmiller, Patrick Richard

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Projectile K-Auger-electron production measurements were performed for the bare, one-, and two-electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of 14 to 23 MeV/amu using a cylindrical mirror analyzer. For the incident two-electron ions, single-electron capture to excited states of the (1s 2s)3S metastable component of the incident beam was the principal mechanism giving rise to the observed K-Auger transitions. For the bare and one-electron ions, double electron capture to excited states was the dominant mechanism leading to K-Auger-electron production. In addition to Auger-spectroscopy measurements, total K-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific n levels of the projectile. The n distributions were also measured for double electron capture to excited states of the bare and one-electron ions.

Original languageEnglish (US)
Pages (from-to)3029-3038
Number of pages10
JournalPhysical Review A
Volume29
Issue number6
DOIs
StatePublished - 1984
Externally publishedYes

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projectiles
electron capture
ions
electrons
excitation
cross sections
Auger spectroscopy
analyzers
mirrors
gases
energy

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Atomic and Molecular Physics, and Optics

Cite this

Projectile K-Auger-electron production by bare, one-, and two-electron ions. / Dillingham, Thomas R; Newcomb, J.; Hall, James; Pepmiller, Philip L.; Richard, Patrick.

In: Physical Review A, Vol. 29, No. 6, 1984, p. 3029-3038.

Research output: Contribution to journalArticle

Dillingham, Thomas R ; Newcomb, J. ; Hall, James ; Pepmiller, Philip L. ; Richard, Patrick. / Projectile K-Auger-electron production by bare, one-, and two-electron ions. In: Physical Review A. 1984 ; Vol. 29, No. 6. pp. 3029-3038.
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