Laser-assisted SIMS of metal-contaminated minerals

Gary Groenewold, Recep Avci, Lee Richards, Jan Sunner, Bob Fox, Jani Ingram

Research output: Contribution to conferencePaper

Abstract

A laser assisted secondary ion mass spectrometry (SIMS) of metal contaminated soils was described. The samples were generated by exposing 10 g of soil to 100 ml of aqueous CsCl solution, which spanned a range of exposure concentrations from environmental to waste type exposures. The spectra was found to be dominated by abundant ions which arose from the prevalent exchangable and mineralized cations in the samples. Since Cs and K have the lowest vapor pressures and melting points of the metals present, the observations suggested a thermal effect that resulted in redistribution of the metals from the interlayer sites on the clays to the surface.

Original languageEnglish (US)
Pages109-110
Number of pages2
StatePublished - Dec 1 2002
Externally publishedYes
EventProceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics - Orlando, FL, United States
Duration: Jun 2 2002Jun 6 2002

Other

OtherProceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics
CountryUnited States
CityOrlando, FL
Period6/2/026/6/02

ASJC Scopus subject areas

  • Spectroscopy

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  • Cite this

    Groenewold, G., Avci, R., Richards, L., Sunner, J., Fox, B., & Ingram, J. (2002). Laser-assisted SIMS of metal-contaminated minerals. 109-110. Paper presented at Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics, Orlando, FL, United States.