Laser-assisted SIMS of metal-contaminated minerals

Gary Groenewold, Recep Avci, Lee Richards, Jan Sunner, Bob Fox, Jani C Ingram

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A laser assisted secondary ion mass spectrometry (SIMS) of metal contaminated soils was described. The samples were generated by exposing 10 g of soil to 100 ml of aqueous CsCl solution, which spanned a range of exposure concentrations from environmental to waste type exposures. The spectra was found to be dominated by abundant ions which arose from the prevalent exchangable and mineralized cations in the samples. Since Cs and K have the lowest vapor pressures and melting points of the metals present, the observations suggested a thermal effect that resulted in redistribution of the metals from the interlayer sites on the clays to the surface.

Original languageEnglish (US)
Title of host publicationProceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics
Pages109-110
Number of pages2
StatePublished - 2002
Externally publishedYes
EventProceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics - Orlando, FL, United States
Duration: Jun 2 2002Jun 6 2002

Other

OtherProceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics
CountryUnited States
CityOrlando, FL
Period6/2/026/6/02

Fingerprint

Secondary ion mass spectrometry
Minerals
Metals
Lasers
Soils
Vapor pressure
Thermal effects
Melting point
Cations
Ions

ASJC Scopus subject areas

  • Spectroscopy

Cite this

Groenewold, G., Avci, R., Richards, L., Sunner, J., Fox, B., & Ingram, J. C. (2002). Laser-assisted SIMS of metal-contaminated minerals. In Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics (pp. 109-110)

Laser-assisted SIMS of metal-contaminated minerals. / Groenewold, Gary; Avci, Recep; Richards, Lee; Sunner, Jan; Fox, Bob; Ingram, Jani C.

Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics. 2002. p. 109-110.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Groenewold, G, Avci, R, Richards, L, Sunner, J, Fox, B & Ingram, JC 2002, Laser-assisted SIMS of metal-contaminated minerals. in Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics. pp. 109-110, Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics, Orlando, FL, United States, 6/2/02.
Groenewold G, Avci R, Richards L, Sunner J, Fox B, Ingram JC. Laser-assisted SIMS of metal-contaminated minerals. In Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics. 2002. p. 109-110
Groenewold, Gary ; Avci, Recep ; Richards, Lee ; Sunner, Jan ; Fox, Bob ; Ingram, Jani C. / Laser-assisted SIMS of metal-contaminated minerals. Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics. 2002. pp. 109-110
@inproceedings{9a8ad04669e84a7cab0d02ff59ccac65,
title = "Laser-assisted SIMS of metal-contaminated minerals",
abstract = "A laser assisted secondary ion mass spectrometry (SIMS) of metal contaminated soils was described. The samples were generated by exposing 10 g of soil to 100 ml of aqueous CsCl solution, which spanned a range of exposure concentrations from environmental to waste type exposures. The spectra was found to be dominated by abundant ions which arose from the prevalent exchangable and mineralized cations in the samples. Since Cs and K have the lowest vapor pressures and melting points of the metals present, the observations suggested a thermal effect that resulted in redistribution of the metals from the interlayer sites on the clays to the surface.",
author = "Gary Groenewold and Recep Avci and Lee Richards and Jan Sunner and Bob Fox and Ingram, {Jani C}",
year = "2002",
language = "English (US)",
pages = "109--110",
booktitle = "Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics",

}

TY - GEN

T1 - Laser-assisted SIMS of metal-contaminated minerals

AU - Groenewold, Gary

AU - Avci, Recep

AU - Richards, Lee

AU - Sunner, Jan

AU - Fox, Bob

AU - Ingram, Jani C

PY - 2002

Y1 - 2002

N2 - A laser assisted secondary ion mass spectrometry (SIMS) of metal contaminated soils was described. The samples were generated by exposing 10 g of soil to 100 ml of aqueous CsCl solution, which spanned a range of exposure concentrations from environmental to waste type exposures. The spectra was found to be dominated by abundant ions which arose from the prevalent exchangable and mineralized cations in the samples. Since Cs and K have the lowest vapor pressures and melting points of the metals present, the observations suggested a thermal effect that resulted in redistribution of the metals from the interlayer sites on the clays to the surface.

AB - A laser assisted secondary ion mass spectrometry (SIMS) of metal contaminated soils was described. The samples were generated by exposing 10 g of soil to 100 ml of aqueous CsCl solution, which spanned a range of exposure concentrations from environmental to waste type exposures. The spectra was found to be dominated by abundant ions which arose from the prevalent exchangable and mineralized cations in the samples. Since Cs and K have the lowest vapor pressures and melting points of the metals present, the observations suggested a thermal effect that resulted in redistribution of the metals from the interlayer sites on the clays to the surface.

UR - http://www.scopus.com/inward/record.url?scp=2442694336&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=2442694336&partnerID=8YFLogxK

M3 - Conference contribution

SP - 109

EP - 110

BT - Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics

ER -