In-situ scanning tunneling microscopy on vapor deposited polyaniline thin films

D. M. Cornelison, Thomas R Dillingham, E. Bullock, N. T. Benally, S. W. Townsend

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Small amounts of polyaniline powder have been evaporated under vacuum onto gold coated mica substrates. The initial deposition has been studied in-situ scanning tunneling microscopy (STM). After low coverage depositions, molecular sized complexes of linear dimensions between 50 and 200 Å were observed. Some internal structure of the polymer conglomerates was resolved, revealing a "C" shaped cluster with a central depression. In some instances, a boundary between these clusters and long cigar shaped polymeric molecules was found. These "cigars" are approximately 400 Å long, but were not highly resolved. The general appearance of the deposited complexes suggests the chemically active evaporated oligomers are reacting on the substrate, building up these conglomerates in the process. Higher resolution scans of individual clusters show single polymer helices, and cross-linking between adjacent polymer chains.

Original languageEnglish (US)
Pages (from-to)87-94
Number of pages8
JournalSurface Science
Volume343
Issue number1-2
DOIs
StatePublished - Dec 1 1995

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Scanning tunneling microscopy
Polyaniline
scanning tunneling microscopy
Polymers
Vapors
vapors
Tobacco Products
Thin films
polymers
thin films
Mica
Substrates
mica
oligomers
Oligomers
Gold
Powders
helices
Vacuum
gold

Keywords

  • Amorphous surfaces
  • Evaporation and sublimation
  • Growth
  • Polyaniline
  • Scanning tunneling microscopy
  • Surface structure, morphology, roughness, and topography
  • Tunneling

ASJC Scopus subject areas

  • Materials Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Physical and Theoretical Chemistry

Cite this

In-situ scanning tunneling microscopy on vapor deposited polyaniline thin films. / Cornelison, D. M.; Dillingham, Thomas R; Bullock, E.; Benally, N. T.; Townsend, S. W.

In: Surface Science, Vol. 343, No. 1-2, 01.12.1995, p. 87-94.

Research output: Contribution to journalArticle

Cornelison, D. M. ; Dillingham, Thomas R ; Bullock, E. ; Benally, N. T. ; Townsend, S. W. / In-situ scanning tunneling microscopy on vapor deposited polyaniline thin films. In: Surface Science. 1995 ; Vol. 343, No. 1-2. pp. 87-94.
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