Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy

Mark A. Zondlo, Timothy B. Onasch, Matthew S. Warshawsky, Margaret A. Tolbert, Govind Mallick, Pamela Arentz, Marin S Robinson

Research output: Contribution to journalArticle

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Abstract

Grazing-angle Fourier transform infrared reflection absorption spectroscopy was used to monitor the free OH stretch (or "dangling bond") in vapor-deposited H2O-ice films between 94 and 120 K. Ice film thicknesses and the sensitivity of our instrument to water-ice molecules were determined by optical interference using a helium-neon laser. These calibrations indicate that the dangling bond signals observed in the present study are indicative of the surfaces of micropores present within the amorphous ice bulk. The largest dangling bond signal (corresponding to the largest number of micropores) was observed at 94 K under conditions of fast ice growth while the smallest signal was observed at 120 K under conditions of slow growth. The temperature and pressure dependence of the dangling bond signal during film growth was used to estimate a barrier to diffusion (Edif) for H2O on amorphous ice. We measured an upper limit of Edif = 4.2 (±0.5) kcal mol-1, consistent with a theoretically derived value of Edif = 2.5-3 kcal mol-1. The decay of the dangling bond over time (corresponding largely to the collapse of the micropores) was monitored in ice films roughly 100 nm thick. With initial deposition rates of 2 nm s-1, the decay took 125 and 175 min at 118 and 112 K, respectively. Faster deposition rates and colder temperatures decreased the decay rate.

Original languageEnglish (US)
Pages (from-to)10887-10895
Number of pages9
JournalJournal of Physical Chemistry B
Volume101
Issue number50
StatePublished - Dec 11 1997

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Steam
Ice
grazing
Absorption spectroscopy
water vapor
Dangling bonds
absorption spectroscopy
ice
Vapors
Water
Deposition rates
Helium neon lasers
helium-neon lasers
Light interference
infrared reflection
decay
Film growth
pressure dependence
decay rates
Film thickness

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Engineering(all)

Cite this

Zondlo, M. A., Onasch, T. B., Warshawsky, M. S., Tolbert, M. A., Mallick, G., Arentz, P., & Robinson, M. S. (1997). Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy. Journal of Physical Chemistry B, 101(50), 10887-10895.

Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy. / Zondlo, Mark A.; Onasch, Timothy B.; Warshawsky, Matthew S.; Tolbert, Margaret A.; Mallick, Govind; Arentz, Pamela; Robinson, Marin S.

In: Journal of Physical Chemistry B, Vol. 101, No. 50, 11.12.1997, p. 10887-10895.

Research output: Contribution to journalArticle

Zondlo, MA, Onasch, TB, Warshawsky, MS, Tolbert, MA, Mallick, G, Arentz, P & Robinson, MS 1997, 'Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy', Journal of Physical Chemistry B, vol. 101, no. 50, pp. 10887-10895.
Zondlo MA, Onasch TB, Warshawsky MS, Tolbert MA, Mallick G, Arentz P et al. Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy. Journal of Physical Chemistry B. 1997 Dec 11;101(50):10887-10895.
Zondlo, Mark A. ; Onasch, Timothy B. ; Warshawsky, Matthew S. ; Tolbert, Margaret A. ; Mallick, Govind ; Arentz, Pamela ; Robinson, Marin S. / Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy. In: Journal of Physical Chemistry B. 1997 ; Vol. 101, No. 50. pp. 10887-10895.
@article{326f4e2360a44728878132172aaa3b9f,
title = "Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy",
abstract = "Grazing-angle Fourier transform infrared reflection absorption spectroscopy was used to monitor the free OH stretch (or {"}dangling bond{"}) in vapor-deposited H2O-ice films between 94 and 120 K. Ice film thicknesses and the sensitivity of our instrument to water-ice molecules were determined by optical interference using a helium-neon laser. These calibrations indicate that the dangling bond signals observed in the present study are indicative of the surfaces of micropores present within the amorphous ice bulk. The largest dangling bond signal (corresponding to the largest number of micropores) was observed at 94 K under conditions of fast ice growth while the smallest signal was observed at 120 K under conditions of slow growth. The temperature and pressure dependence of the dangling bond signal during film growth was used to estimate a barrier to diffusion (Edif) for H2O on amorphous ice. We measured an upper limit of Edif = 4.2 (±0.5) kcal mol-1, consistent with a theoretically derived value of Edif = 2.5-3 kcal mol-1. The decay of the dangling bond over time (corresponding largely to the collapse of the micropores) was monitored in ice films roughly 100 nm thick. With initial deposition rates of 2 nm s-1, the decay took 125 and 175 min at 118 and 112 K, respectively. Faster deposition rates and colder temperatures decreased the decay rate.",
author = "Zondlo, {Mark A.} and Onasch, {Timothy B.} and Warshawsky, {Matthew S.} and Tolbert, {Margaret A.} and Govind Mallick and Pamela Arentz and Robinson, {Marin S}",
year = "1997",
month = "12",
day = "11",
language = "English (US)",
volume = "101",
pages = "10887--10895",
journal = "Journal of Physical Chemistry B Materials",
issn = "1089-5647",
publisher = "American Chemical Society",
number = "50",

}

TY - JOUR

T1 - Experimental studies of vapor-deposited water-ice films using grazing-angle FTIR-reflection absorption spectroscopy

AU - Zondlo, Mark A.

AU - Onasch, Timothy B.

AU - Warshawsky, Matthew S.

AU - Tolbert, Margaret A.

AU - Mallick, Govind

AU - Arentz, Pamela

AU - Robinson, Marin S

PY - 1997/12/11

Y1 - 1997/12/11

N2 - Grazing-angle Fourier transform infrared reflection absorption spectroscopy was used to monitor the free OH stretch (or "dangling bond") in vapor-deposited H2O-ice films between 94 and 120 K. Ice film thicknesses and the sensitivity of our instrument to water-ice molecules were determined by optical interference using a helium-neon laser. These calibrations indicate that the dangling bond signals observed in the present study are indicative of the surfaces of micropores present within the amorphous ice bulk. The largest dangling bond signal (corresponding to the largest number of micropores) was observed at 94 K under conditions of fast ice growth while the smallest signal was observed at 120 K under conditions of slow growth. The temperature and pressure dependence of the dangling bond signal during film growth was used to estimate a barrier to diffusion (Edif) for H2O on amorphous ice. We measured an upper limit of Edif = 4.2 (±0.5) kcal mol-1, consistent with a theoretically derived value of Edif = 2.5-3 kcal mol-1. The decay of the dangling bond over time (corresponding largely to the collapse of the micropores) was monitored in ice films roughly 100 nm thick. With initial deposition rates of 2 nm s-1, the decay took 125 and 175 min at 118 and 112 K, respectively. Faster deposition rates and colder temperatures decreased the decay rate.

AB - Grazing-angle Fourier transform infrared reflection absorption spectroscopy was used to monitor the free OH stretch (or "dangling bond") in vapor-deposited H2O-ice films between 94 and 120 K. Ice film thicknesses and the sensitivity of our instrument to water-ice molecules were determined by optical interference using a helium-neon laser. These calibrations indicate that the dangling bond signals observed in the present study are indicative of the surfaces of micropores present within the amorphous ice bulk. The largest dangling bond signal (corresponding to the largest number of micropores) was observed at 94 K under conditions of fast ice growth while the smallest signal was observed at 120 K under conditions of slow growth. The temperature and pressure dependence of the dangling bond signal during film growth was used to estimate a barrier to diffusion (Edif) for H2O on amorphous ice. We measured an upper limit of Edif = 4.2 (±0.5) kcal mol-1, consistent with a theoretically derived value of Edif = 2.5-3 kcal mol-1. The decay of the dangling bond over time (corresponding largely to the collapse of the micropores) was monitored in ice films roughly 100 nm thick. With initial deposition rates of 2 nm s-1, the decay took 125 and 175 min at 118 and 112 K, respectively. Faster deposition rates and colder temperatures decreased the decay rate.

UR - http://www.scopus.com/inward/record.url?scp=0031384692&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031384692&partnerID=8YFLogxK

M3 - Article

VL - 101

SP - 10887

EP - 10895

JO - Journal of Physical Chemistry B Materials

JF - Journal of Physical Chemistry B Materials

SN - 1089-5647

IS - 50

ER -