Characterization of bis-(phenoxy)phosphazene polymers using static secondary ion mass spectrometry

G. S. Groenewold, R. L. Cowan, Jani C Ingram, A. D. Appelhans, J. E. Delmore, J. E. Olson

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Phosphazene polymers are a class of materials that are finding applications in membrane separations. A series of substituted bis(phenoxy)phosphazene polymers were characterized using static secondary ion mass spectrometry. The anion spectra contained ions which originate from the phosphazene backbone, as well as from the pendant aromatic moieties. The cation spectra also contained ions derived from the pendant moieties, but consisted primarily of ions which arise from adventitious surface contaminants, such as siloxane compounds and hydrocarbons. The backbone-derived ions could be distinguished from the pendant-derived ions on the basis of their response to prolonged primary ion bombardment: the pendant ions decay at rates that are generally two to four times the rates observed for the backbone ions. This observation is interpreted in terms of the pendant moieties being more easily removed during ablation than the backbone ions.

Original languageEnglish (US)
Pages (from-to)794-802
Number of pages9
JournalSurface and Interface Analysis
Volume24
Issue number12
StatePublished - Nov 1996
Externally publishedYes

Fingerprint

phosphazene
Secondary ion mass spectrometry
secondary ion mass spectrometry
Polymers
Ions
polymers
ions
Siloxanes
Ion bombardment
Hydrocarbons
Ablation
siloxanes
Anions
Cations
ablation
Negative ions
contaminants
bombardment
Positive ions
Impurities

ASJC Scopus subject areas

  • Colloid and Surface Chemistry
  • Physical and Theoretical Chemistry

Cite this

Groenewold, G. S., Cowan, R. L., Ingram, J. C., Appelhans, A. D., Delmore, J. E., & Olson, J. E. (1996). Characterization of bis-(phenoxy)phosphazene polymers using static secondary ion mass spectrometry. Surface and Interface Analysis, 24(12), 794-802.

Characterization of bis-(phenoxy)phosphazene polymers using static secondary ion mass spectrometry. / Groenewold, G. S.; Cowan, R. L.; Ingram, Jani C; Appelhans, A. D.; Delmore, J. E.; Olson, J. E.

In: Surface and Interface Analysis, Vol. 24, No. 12, 11.1996, p. 794-802.

Research output: Contribution to journalArticle

Groenewold, GS, Cowan, RL, Ingram, JC, Appelhans, AD, Delmore, JE & Olson, JE 1996, 'Characterization of bis-(phenoxy)phosphazene polymers using static secondary ion mass spectrometry', Surface and Interface Analysis, vol. 24, no. 12, pp. 794-802.
Groenewold, G. S. ; Cowan, R. L. ; Ingram, Jani C ; Appelhans, A. D. ; Delmore, J. E. ; Olson, J. E. / Characterization of bis-(phenoxy)phosphazene polymers using static secondary ion mass spectrometry. In: Surface and Interface Analysis. 1996 ; Vol. 24, No. 12. pp. 794-802.
@article{f69885f9d73d463e954ac97157ff4254,
title = "Characterization of bis-(phenoxy)phosphazene polymers using static secondary ion mass spectrometry",
abstract = "Phosphazene polymers are a class of materials that are finding applications in membrane separations. A series of substituted bis(phenoxy)phosphazene polymers were characterized using static secondary ion mass spectrometry. The anion spectra contained ions which originate from the phosphazene backbone, as well as from the pendant aromatic moieties. The cation spectra also contained ions derived from the pendant moieties, but consisted primarily of ions which arise from adventitious surface contaminants, such as siloxane compounds and hydrocarbons. The backbone-derived ions could be distinguished from the pendant-derived ions on the basis of their response to prolonged primary ion bombardment: the pendant ions decay at rates that are generally two to four times the rates observed for the backbone ions. This observation is interpreted in terms of the pendant moieties being more easily removed during ablation than the backbone ions.",
author = "Groenewold, {G. S.} and Cowan, {R. L.} and Ingram, {Jani C} and Appelhans, {A. D.} and Delmore, {J. E.} and Olson, {J. E.}",
year = "1996",
month = "11",
language = "English (US)",
volume = "24",
pages = "794--802",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "12",

}

TY - JOUR

T1 - Characterization of bis-(phenoxy)phosphazene polymers using static secondary ion mass spectrometry

AU - Groenewold, G. S.

AU - Cowan, R. L.

AU - Ingram, Jani C

AU - Appelhans, A. D.

AU - Delmore, J. E.

AU - Olson, J. E.

PY - 1996/11

Y1 - 1996/11

N2 - Phosphazene polymers are a class of materials that are finding applications in membrane separations. A series of substituted bis(phenoxy)phosphazene polymers were characterized using static secondary ion mass spectrometry. The anion spectra contained ions which originate from the phosphazene backbone, as well as from the pendant aromatic moieties. The cation spectra also contained ions derived from the pendant moieties, but consisted primarily of ions which arise from adventitious surface contaminants, such as siloxane compounds and hydrocarbons. The backbone-derived ions could be distinguished from the pendant-derived ions on the basis of their response to prolonged primary ion bombardment: the pendant ions decay at rates that are generally two to four times the rates observed for the backbone ions. This observation is interpreted in terms of the pendant moieties being more easily removed during ablation than the backbone ions.

AB - Phosphazene polymers are a class of materials that are finding applications in membrane separations. A series of substituted bis(phenoxy)phosphazene polymers were characterized using static secondary ion mass spectrometry. The anion spectra contained ions which originate from the phosphazene backbone, as well as from the pendant aromatic moieties. The cation spectra also contained ions derived from the pendant moieties, but consisted primarily of ions which arise from adventitious surface contaminants, such as siloxane compounds and hydrocarbons. The backbone-derived ions could be distinguished from the pendant-derived ions on the basis of their response to prolonged primary ion bombardment: the pendant ions decay at rates that are generally two to four times the rates observed for the backbone ions. This observation is interpreted in terms of the pendant moieties being more easily removed during ablation than the backbone ions.

UR - http://www.scopus.com/inward/record.url?scp=0030290755&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030290755&partnerID=8YFLogxK

M3 - Article

VL - 24

SP - 794

EP - 802

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 12

ER -