A versatile test bench for wireless RF/microwave component characterization

Wrence P. Dunleavy, Thomas M. Weller, Paul G Flikkema, Horace C. Gordon, Rudolf E. Henning

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.

Original languageEnglish (US)
Pages (from-to)304-312
Number of pages9
JournalMicrowave Journal
Volume41
Issue number5
StatePublished - May 1998
Externally publishedYes

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Networks and Communications

Cite this

Dunleavy, W. P., Weller, T. M., Flikkema, P. G., Gordon, H. C., & Henning, R. E. (1998). A versatile test bench for wireless RF/microwave component characterization. Microwave Journal, 41(5), 304-312.