Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.
|Original language||English (US)|
|Number of pages||9|
|State||Published - May 1 1998|
ASJC Scopus subject areas
- Electrical and Electronic Engineering