• 728 Citations
  • 18 h-Index
1990 …2020

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Conference article
Conference article

Molecular beam static secondary ion mass spectrometry for surface analysis

Appelhans, A. D., Groenewold, G. S., Ingram, J. C., Dahl, D. A. & Delmore, J. E., Apr 7 1995, In : Proceedings of SPIE - The International Society for Optical Engineering. 2385, p. 59-67 9 p.

Research output: Contribution to journalConference article

Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

Gresham, G. L., Groenewold, G. S., Bauer, W. F., Ingram, J. C. & Avci, R., Jan 1 1999, In : Proceedings of SPIE - The International Society for Optical Engineering. 3576, p. 66-72 7 p.

Research output: Contribution to journalConference article

2 Scopus citations