• 65 Citations
  • 4 h-Index
1989 …2017

Research output per year

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Research Output

  • 65 Citations
  • 4 h-Index
  • 9 Conference article
  • 4 Article
  • 2 Conference contribution
  • 1 Paper
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Paper
2004

Initial results on the development of A new wafer inspection paradigm

El Doker, T. A., King, J. & Scott, D. R., Jun 22 2004, p. 124-127. 4 p.

Research output: Contribution to conferencePaper